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Item Information   Holdings       More by this author     Khan, Nasir, author.     Milwaukee School of Engineering     Subjects     Automatic data collection systems -- Testing     Analog-to-digital converters -- Testing     Signal processing     MSE Project.     Browse Catalog     by author:      Khan, Nasir, author.      Milwaukee School of Engineering       by title:      Development of an on...         MARC Display

Development of an on-board test circuit for evaluating the performance of data acquisition system : a report submitted to the faculty of the Milwaukee School of Engineering in partial fulfillment of the requirements for the degree of Master of Science in Engineering / by Nasir Khan. by Khan, Nasir, author., Milwaukee School of Engineering Subjects Automatic data collection systems -- Testing   Analog-to-digital converters -- Testing   Signal processing   MSE Project. Description:  77 leaves : illustrations, some of which are in color ; 29 cm. Contents:  Introduction -- Description of project -- Review of literature -- Clock divider -- Filter design -- Project specifications -- Implementation and integration results -- Conclusions and future work -- Appendix A. Fourier analysis of a unipolar square wave -- B. PCB design -- C. ADC characteristics. Data Acquisition Systems (DAS) have wide applications in biomedical engineering. Since performance evaluation of data converters and data acquisition systems have various challenges--such as large test time, detection of missing codes and accuracy of performance specifications (Signal-to-Noise-Ratio (SNR), offset, gain, differential and integral non-Linearties, etc)--it is essential to know the performance of the DAS for diagnostic purposes. The goal of this project is to develop hardware and software tools that can be easily implemented during the development phase of DAS to provide the performance evaluation feature of the Analog-to-Digital (A/D) converter and the data acquisition system. In the test mode the process includes generation of a sinusoidal input signal from the clock signal of the DAS using clock dividers and filter circuits. All timing signals required by the A/D converter under test are generated also. The digital data from the Device Under Test (DUT) are stored in a Personal Computer (PC) and are analyzed using the Discrete Fourier Transform (DFT) and statistical tools. The proposed testing method can be easily adaptable to provide a real-time self-test for any data acquisition system and A/D converter IC (Integrated-Circuit). Form:  text unmediated volume   Copy/Holding information Location Collection Call No. Status   Walter Schroeder Library Master's Theses AC805 .K47 2008 Available Add Copy to MyList Format: HTMLPlain textDelimited Subject:   Email to:

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